Texas Instruments SN74BCT8374ADWR

SN74BCT8374ADWR


  • Manufacturer: Texas Instruments
  • AIBOSI NO: SN74BCT8374ADWR
  • Package: 24-SOIC (0.295", 7.50mm Width)
  • Datasheet:
  • Stock: 96930000
  • Description: Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
  • Price:

Quantity:

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2. Since inventories and prices may fluctuate to some extent, the sales manager is going to reconfirm the order and let you know if there are any updates.

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The basic freight (for package ≤0.5kg or corresponding volume) depends on the time zone and country.

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FedEx International, 5-7 business days.

The following are some common countries' logistic time.
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SPECIFICATIONS

Parameters
Mfr Texas Instruments
Series 74BCT
Package Tape & Reel (TR)
Product Status Obsolete
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295", 7.50mm Width)
Supplier Device Package 24-SOIC
Base Product Number 74BCT8374
RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001
Standard Package 2,000
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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